I support a wide variety of projects in Materials Characterization using the following microscopy techniques: Transmission Electron Microscopy (TEM) and corresponding sample preparation including dicing, grinding, polishing, dimpling, ion-milling, and ultramicrotomy. DualBeam FIB/SEM (Scanning Electron Microscopy, Focused Ion Beam), X-ray analysis (EDX), Omniprobe micromanipulation, 3D serial imaging in the SEM, sample preparation for TEM using the FIB, and SEM cross-sectioning sample preparation. Optical microscopy