Electrical Characterization and Reliability       

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Electrical Characterization and Reliability - overview


We work to understand the fundamentals of reliability and electrical properties of semiconductor devices, including high-k/metal-gate CMOS devices and interconnects.

We work at the IBM Watson Research Center in Yorktown Heights NY, the Albany Nanotechnology consortium in Albany NY, and with our colleagues at the IBM Server Division, where we collaborate with other researchers in IBM and partner companies including (current and past partners listed):GLOBALFOUNDRIESSamsung, Toshiba, STMicroelectronics, United Microelectronics Corp (UMC)NECEL, and Renesas.