Materials Analysis - Scanning Probe Laboratory
The atomic force microscope (AFM) images features on the scale of several Angstroms, nanometers and microns. It is most commonly used to measure topography — profiles of surfaces. An AFM can also be configured to measure other forces, for example: magnetic, electrostatic, adhesive and elastic. By measuring very localized forces over a surface, a map of the surface is produced. By associating the force map with topography, structure-property correlations can be drawn. With the ability to sample forces over very small areas of Angstroms or nanometers, the AFM is an important instrument in documenting the scaling of properties from the traditional 'macroscopic' regime down to the regime of collections of several molecules.
Our AFM instrumentation operates in several modes: contact, intermittent contact, noncontact and nonscanning. Samples of many different dimensions are accommodated nondestructively on AFM's with both small and large sample stages.
Two large-stage atomic force microscopes (AFM): contact, intermittent contact, and non-contact imaging modes; one with x,y-stage and one with either (r,Theta) or rotary stage. Two small-stage atomic force microscopes (AFM): contact, intermittent contact, and non-contact imaging modes; solution cell; scanners: 5µm, 100µm, and closed loop. Lab's capabilities also include conductive and magnetic force imaging. Projects using AFM characterization