Emission-based IC Diagnostics       

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Emission-based IC Diagnostics - Publications


  • Tester-Based Optical and Electrical Diagnostic System and Techniques P. Song and F. Stellari Proc. of IEEE VLSI Test Symposium (VTS), pp. 209-214, 2012
  • Root cause identification of an hard-to-find on-chip power supply coupling fail F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Toprak-Deniz, J.F. Bulzacchelli, and N.A. Mitra Proc. of IEEE International Test Conference (ITC), 2012
  • Advanced methods and software for enhancing analytical tools capabilities during chip diagnostic and characterization F. Stellari and P. Song Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2012
  • Characterization of the Digital PLLs on an 8-Core Microprocessor Using Electrical and Optical Techniques K. Stawiasz, K.A. Jenkins, P. Song, F. Stellari, J. Tierno, A. Rylyakov, and D. Friedman IEEE VLSI Test Symposium (VTS), 2011
  • Mapping Systematic and Random Process Variations using Light Emission from Off-State Leakage F. Stellari, P. Song, A.J. Weger, and D.L. Miles Proc. of International Symposium on Physics and Reliability (IRPS), pp. 640-649, 2009
  • On-Chip Power Supply Noise Measurement using Time Resolved Emission (TRE) Waveforms of Light Emission from Off-State Leakage Current (LEOSLC) F. Stellari, P. Song, J. Sylvestri, D. Miles, O. Forlenza, and D. Forlenza Proc. of International Test Conference (ITC), pp. 8.1-8.10, 2009
  • Optical Diagnostics for IBM POWER6TM Microprocessor P. Song, S. Ippolito, F. Stellari, J. Sylvestri, T. Diemoz, G. Smith, P. Muench, N. James, S. Kim, and H. Saenz Proc. of International Test Conference (ITC), pp. Paper 17.3, 2008
  • Switching Time Extraction of CMOS Gates using Time-Resolved Emission (TRE) F. Stellari, A. Tosi, and P. Song Proc. of International Symposium on Physics and Reliability (IRPS), pp. 566-573, 2006
  • High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images F. Stellari, P. Song, T.E. Diemoz, A.J. Weger, T. Vogel, S.C. Wilson, J. Pennings, and R.F. Rizzolo Proc. of International Test Conference, (ITC), pp. 1-10, 2006
  • Testing of Ultra Low Voltage CMOS Microprocessors using the Superconducting Single-Photon Detector (SSPD) F. Stellari and P. Song Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 2, 2005
  • Characterization of a 0.13 um CMOS Link Chip using Time Resolved Emission (TRE) F. Stellari, P. Song, J. Hryckowian, O.A. Torreiter, S. Wilson, P. Wu, and A. Tosi Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1550-1553, 2005
  • CMOS IC diagnostics using the Light Emission from Off-state Leakage Currents P. Song, S. Polonsky, F. Stellari, K. Jenkins, A.J. Weger, T. Xia, and S. Cho Electronic Device Failure Analysis (EDFA) 7(3), 12-19, 2005
  • Local Probing of Switching Noise in VLSI Chips using Time Resolved Emission (TRE) F. Stellari, P. Song, and W.D. Becker Proc. of IEEE North Atlantic Test Workshop (NATW), pp. 130-137, 2005
  • Advanced Optical Testing of an Array in 65 nm CMOS Technology F. Stellari, P. Song, and T.A. Christensen Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 355-362, 2005
  • An Advanced Optical Diagnostic Technique for IBM Microprocessor P. Song, F. Stellari, B. Huott, O. Wagner, U. Srinivasan, Y. Chan, R. Rizzolo, H.J. Nam, J. Eckhardt, T. McNamara, C-L Tong, S. Wilson, A.J. Weger, and M.K. McManus Proc. of International Test Conference, (ITC), pp. 48.1-48.9, 2005
  • Photon emission microscopy of inter/intra chip device performance variations S Polonsky, M Bhushan, A Gattiker, A Weger, P Song Microelectronics Reliability,45, 1471-1475, 2005
  • Testing of a Low Voltage 0.13 um CMOS Technology Microprocessor using a High Sensitivity Superconducting Single-Photon Detector F. Stellari and P. Song Proc. of IEEE North Atlantic Test Workshop (NATW), pp. 151-156, 2004
  • Testing of ultra low voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD) F. Stellari and P. Song Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 205-209, 2004
  • A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current P. Song, F. Stellari, T. Xia, and A.J. Weger Proc. of International Test Conference, (ITC), pp. 140-147, 2004
  • Broken Scan Chain Diagnostics based on Time-Integrated and Time-Dependent Emission Measurements F. Stellari, P. Song, T. Xia, and A.J. Weger Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 52-57, 2004
  • Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD) P. Song, F. Stellari, J.P. Eckhardt, T. McNamara, and C-L Tong Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 197-202, 2004
  • Analysis of factors impacting latchup in I/O interface circuits using a combined optical and electrical testing method F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K.V. Chatty, M. Muhammad, and P. Sanda Electronic Device Failure Analysis (EDFA), 20-29, 2004
  • Electrical and optical characterization of latchup F. Stellari, P. Song, A. Weger, M.K. McManus, R. Gauthier, and P. Sanda Microelectronic Failure Analysis Desk Reference (MFADR), 174-192, 2004
  • Testing and diagnostics of CMOS circuits using Light Emission from Off-State Leakage Current F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen IEEE Trans. on Electron Devices 51(9), 1455-1462 , 2004
  • Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup A.J. Weger, S. Voldman, F. Stellari, P. Song, P. Sanda, and M.K. McManus Proc. of International Symposium on Physics and Reliability (IRPS), pp. 99-104, 2003
  • Optical and Electrical Testing of Latchup in I/O Interface Circuits F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K. Chatty, M. Muhammad, and P. Sanda Proc. of International Test Conference, (ITC), pp. 236-245, 2003
  • Latchup Analysis Using Emission Microscopy F. Stellari, P. Song, M.K. McManus, A.J. Weger, R. Gauthier, K.V. Chatty, M. Muhammad, P. Sanda, P. Wu and S. Wilson Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1603-1608, 2003
  • Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy F. Stellari, P. Song, M.K. McManus, A.J. Weger, R.J. Gauthier, K.V. Chatty, M. Muhammad, and P. Sanda Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 19-24, 2003
  • Time-Resolved Optical Measurements from 0.13 um CMOS Technology Microprocessor using a Superconducting Single-Photon Detector F. Stellari, P. Song, A.J. Weger, and M.K. McManus Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 40-44, 2003
  • Testing of Low Power CMOS Circuits using Optical Emission from Leakage Current P. Song, F. Stellari, J.C. Tsang, M.K. McManus, and M.B. Ketchen Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2003
  • Time-Resolved Emission Testing Challenges for Low Voltage CMOS Technologies P. Song, F. Stellari, and M.K. McManus Proc. of Laser and Electro-Optics Society (LEOS), pp. 596-597, 2003
  • Circuit Voltage Probe Based on Static Optical Emission Measurements F. Stellari, P. Song, J.C. Tsang, M.K. McManus and M.B. Ketchen Microelectronic Reliability42, 1689-1694, 2002
  • Timing Characterization Multiple Time Domains Al Weger, M. McManus, P. Song, A. Muszuynski Proc of 28th IEEE International Symposium for Testing and Failure Analysis (ISTFA), pp. 663-666, 2002
  • Optical diagnosis of excess IDDQ in low power CMOS circuits F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1689-1694 , 2002
  • Circuit voltage probe based on time-integrated measurements of optical emission from leakage current F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 667-672, 2002
  • Picosecond Imaging Circuit Analysis of ULSI Microprocessor M. McManus, P. Song IEEE Microwave Symposium, pp. 1505-1508, 2002
  • Diagnosis of faulty I/O circuit using PICA P. Song, M. McManus, F. Motika, D. Knebel Electronic Device Failure Analysis (EDFA) 4(1), 12-16, 2002
  • High Resolution Diagnostic Techniques for the IBM S/390 Microprocessor P. Song, F. Motika, M. Kusko, R. Rizzolo, J. Lee, R. Clairmont Proc. of 8th IEEE North Atlantic Test Workshop, pp. 67-75, 1999
  • Diagnostic Techniques for the IBM S/390 600-MHz G5 Microprocessor P. Song, F. Motika, D. Knebel, R. Rizzolo, M. Kusko Proc. of IEEE International Test Conference, pp. 1073-1082, 1999
  • S/390 G5 CMOS Microprocessor Diagnostics P. Song, F. Motika, D. Knebel, R. Rizzolo, M. Kusko Journal of Research and Development 43(5/6), 899-914, 1999
  • Diagnosis of AC Faults in IBM S/390 CPU Chip P. Song, F. Motika, J. Lee Proc of 7th IEEE Atlantic Test Workshop, pp. 73-76, 1998
  • Diagnosis and Characterization of Timing-Related Defects by Time-Dependent Light Emission D. Knebel, P. Sanda, M. McManus, J. Kash, J. Tsang, D. Vallett, L. Huisman, P. Nigh, R. Rizzolo, P. Song, F. Motika Proc. of IEEE International Test Conference, pp. 733-739, 1998
  • Microprocessor Test and Test Tool Methodology for the 500MHz IBM S/390 G5 Chip M. Kusko, B. Robbins, T. Snethen, P. Song, T. Foote, W. Huott Proc. of IEEE International Test Conference, pp. 717-726, 1998