Optical Diagnostics Tool Development       

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Optical Diagnostics Tool Development - Publications/Patents


  • A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits Franco Stellari, Alan J. Weger, Seongwon Kim, Dzmitry Maliuk, Peilin Song, Herschel A. Ainspan, Young Kwark, Christian W. Baks, and Ulrike Kindereit, To be presented at International Symposium for Testing and Failure Analysis (ISTFA), 2013
  • Near-infrared Photon Emission Spectroscopy of a 45 nm SOI Ring Oscillator U. Kidereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni Proc. of International Symposium on Physics and Reliability (IRPS), 2012
  • Comparison of Near-Infrared Photon Emission Spectroscopy of a 45 nm and 32 nm SOI Ring Oscillators U. Kidereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2012
  • Single-photon detectors for ultra-low-voltage time-resolved emission measurements of VLSI circuits F. Stellari, P. Song, and A.J. Weger SPIE Defense, Security & Sensing - Advanced Photon Counting Techniques V, 2011
  • Single Photon Detectors for Ultra Low Voltage Time Resolved Emission Measurements F. Stellari, P. Song, and A.J. Weger IEEE J. on Quantum Electronics 47(6), 841-848, 2011
  • A Position Sensitive Single Photon Detector with Enhanced NIR Response F. Stellari, P. Song, A.J. Weger, T. Nakamura, S. Kim, and R. Roche, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2011
  • Evaluating PICA capability for future low voltage SOI chips F. Stellari, P. Song, J. Vickers, C. Shaw, S. Kasapi, and R. Ispasoiu Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 407-416, 2008
  • Time-Resolved Emission Testing Challenges for Low Voltage CMOS Technologies P. Song, F. Stellari, and M.K. McManus Proc. of Laser and Electro-Optics Society (LEOS), pp. 596-597, 2003
  • Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system Franco Stellari, Alberto Tosi, Franco Zappa, Peilin Song Patent US Patent 8,115,170
  • Angular spectrum tailoring in solid immersion microscopy for circuit analysis Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song, John D. Sylvestri Patent US Patent 7,961,307
  • Angular spectrum tailoring in solid immersion microscopy for circuit analysis Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song, John D. Sylvestri Patent US Patent 7,826,045
  • Optical trigger for PICA technique Franco Stellari, Peilin Song Patent US Patent 7,239,157
  • Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis Timothy J. Koprowski, Mary P. Kusko, Richard F. Rizzolo, Peilin Song Patent US Patent 6,442,720