Jaione Tirapu Azpiroz  Jaione Tirapu Azpiroz photo       

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Researcher
IBM Research - Brazil, Rio de Janeiro, RJ, 22290-240

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Professional Associations

Professional Associations:  IEEE  |  SPIE -- International Society of Optical Engineering


2016

MASK THAT PROVIDES IMPROVED FOCUS CONTROL USING ORTHOGONAL EDGES
Jaione Tirapu Azpiroz, Alan E Rosenbluth, Timothy A Brunner
US Patent 9310674


2013

METHOD FOR CALIBRATING AN SRAF PRINTING MODEL
Jaione Tirapu Azpiroz, Ramya Viswanathan
US Patent 8458626

SYSTEM AND METHOD FOR PROJECTION LITHOGRAPHY WITH IMMERSED IMAGE-ALIGNED DIFFRACTIVE ELEMENT
Dario Gil, David O. Melville, Alan E. Rosenbluth, Kehan Tian, Jaione Tirapu Azpiroz,
US Patent 8537444

METHOD FOR GENERATING A PLURALITY OF OPTIMIZED WAVEFRONTS FOR A MULTIPLE EXPOSURE LITHOGRAPHIC PROCESS
Saeed Bagheri, Kafai Lai, David O. Melville, Alan E. Rosenbluth, Kehan Tian, Jaione Tirapu Azpiroz
US Patent 8495528

METHOD TO MATCH EXPOSURE TOOLS USING A PROGRAMMABLE ILLUMINATOR
Jaione Tirapu Azpiroz, Saeed Bagheri, Kafai Lai, David O. Melville, Alan E. Rosenbluth, Kehan Tian
US Patent 8351037

METHOD FOR OPTIMIZING SOURCE AND MASK TO CONTROL LINE WIDTH ROUGHNESS AND IMAGE LOG SLOPE
Kehan Tian, Alan E. Rosenbluth, David O. Melville, Jaione Tirapu Azpiroz, Saeed Bagheri, Kafai Lai,
US Patent 8372565


2012

HIGH RESOLUTION IMAGING PROCESS USING AN IN-SITU IMAGE MODIFYING LAYER
Kaushal Patel, Wu-Song Huang, Margaret C. Lawson, Jaione Tirapu Azpiroz
Japan Patent 5079012

HIGH RESOLUTION IMAGING PROCESS USING AN IN-SITU IMAGE MODIFYING LAYER
Kaushal Patel, Wu-Song Huang, Margaret C. Lawson, Jaione Tirapu Azpiroz
China Patent ZL200780037691.0

METHOD FOR FORMING ARBITRARY LITHOGRAPHIC WAVEFRONTS USING STANDARD MASK TECHNOLOGY
Alan E. Rosenbluth, Jaione Tirapu-Azpiroz,
US Patent 8108802

EMF CORRECTION MODEL CALIBRATION USING ASYMMETRY FACTOR DATA OBTAINED FROM AERIAL IMAGES OR A PATTERNED LAYER
Jaione Tirapu-Azpiroz, Timothy A. Brunner, Michael S. Hibbs, Alan E. Rosenbluth,
US Patent 8271910


2011

CALCULATING IMAGE INTENSITY OF MASK BY DECOMPOSING MANHATTAN POLYGON BASED ON PARALLEL EDGE
Jaione Tirapu-Azpiroz, Kafai Lai, David O. S. Melville, Alan E. Rosenbluth, Kehan Tian
US Patent 8059885

EFFICIENT ISOTROPIC MODELING APPROACH TO INCORPORATE ELECTROMAGNETIC EFFECTS INTO LITHOGRAPHIC PROCESS SIMULATIONS
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, Ioana Graur
US Patent 8078995


2010

HIGH RESOLUTION IMAGING PROCESS USING AN IN-SITU IMAGE MODIFYING LAYER
Kaushal Patel, Wu-Song Huang, Margaret C. Lawson, Jaione Tirapu Azpiroz
US Patent 7709187