Vitali Sokhin  Vitali Sokhin photo       

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Threadmill team lead
Haifa Research Lab, Haifa, Israel
  +972dash4dash829dash6162

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2016

Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification
Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco
Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016, pp. 24:1--24:6

Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms
Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung{-}Boem Park, Wookyeong Jeong, Jae{-}Cheol Son
IEEE Design & Test , IEEE, 2016


2015

Comparative study of test generation methods for simulation accelerators
Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung{-}Boem Park, Wookyeong Jeong, Jae{-}Cheol Son
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 321--324


2014

Effective post-silicon failure localization using dynamic program slicing
Ophir Friedler and Wisam Kadry and Arkadiy Morgenshtein and Amir Nahir and Vitali Sokhin
Proceedings of the conference on Design, Automation & Test in Europe, pp. 319, 2014


2013


Post-Silicon Debugging of Transactional Memory Tests
Ophir Friedler, Wisam Kadry, Amir Nahir, Vitali Sokhin, Carla Ferreira and Joao Lourenco
Euro-TM Workshop on Transactional Memory (WTM 2013)

Improving Utilization of Acceleration Platforms by Using Off-Platform Test Generation
Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Elena Tsanko
ChipEx, 2013


2011

Threadmill: A post-silicon exerciser for multi-threaded processors
A. Adir, M. Golubev, S. Landa, A. Nahir, G. Shurek, V. Sokhin, A. Ziv
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE, pp. 860--865




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