Peilin Song  Peilin Song photo       

contact information

Principal RSM & Manager, Circuit Test and Diagnostics Technologies
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash3990

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Professional Associations

Professional Associations:  IEEE Circuits and System Society  |  IEEE Computer Society


2013

Self-adjusting critical path timing of multi-core VLSI chip
Peilin Song, Franco Stellari
Patent US Patent 8,412,993


2012


Constructing variability maps by correlating off-state leakage emission images to layout information
Stanislav Polonsky, Peilin Song, Franco Stellari, Alan J. Weger
Patent US Patent 8,131,056

Apparatus and methods for packaging electronic devices for optical testing
Franco Stellari, Alberto Tosi, Peilin Song
Patent US Patent 8,193,009

Navigating analytical tools using layout software
Franco Stellari, Peilin Song
Patent US Patent 8,312,413

Creating emission images of integrated circuits
Franco Stellari, Peilin Song
Patent US Patent 8,331,726


2011

Process variation on-chip sensor
Mesut Meterelliyoz, Peilin Song, Franco Stellari
Patent US Patent 7,868,606

Apparatus and methods for packaging electronic devices for optical testing
Alberto Tosi, Franco Stellari, Peilin Song
Patent US Patent 7,927,898

On-chip detection of power supply vulnerabilities
Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
Patent US Patent 7,952,370

Angular spectrum tailoring in solid immersion microscopy for circuit analysis
Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song, John D. Sylvestri
Patent US Patent 7,961,307

System and method for virtual control of laboratory equipment
Franco Stellari, Steven E. Steen, Peilin Song
Patent US Patent 8,041,437


2010

On-chip detection of power supply vulnerabilities
Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
Patent US Patent 7,646,208

Method and apparatus for diagnosing broken scan chain based on leakage light emission
Peilin Song, Tian Xia, Alan Weger, Franco Stellari, Stanislav V. Polonsky
Patent US Patent 7,788,058

Angular spectrum tailoring in solid immersion microscopy for circuit analysis
Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song, John D. Sylvestri
Patent US Patent 7,826,045


2009

Measuring and predicting VLSI chip reliability and failure
Peilin Song, David Heidel, Franco Motika, Franco Stellari
Patent US Patent 7,480,882


Apparatus and methods for packaging electronic devices for optical testing
Alberto Tosi, Franco Stellari, Peilin Song
Patent US Patent 7,635,904


2008

On-chip detection of power supply vulnerabilities
Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
Patent US Patent 7,355,435

Enhanced signal observability for circuit analysis
Chandler Todd McDowell, Stanislav Polonsky, Peilin Song, Franco Stellari, Alan J. Weger
Patent US Patent 7,355,419

On-chip power supply noise detector
Keith A. Jenkins, Anuja Sehgal, Peilin Song
Patent US Patent 7,355,429


Method and apparatus for diagnosing broken scan chain based on leakage light emission
Peilin Song, Tian Xia, Alan Weger, Franco Stellari, Stanislav V. Polonsky
Patent US Patent 7,426,448

On-chip power supply noise detector
Keith A. Jenkins, Anuja Sehgal, Peilin Song
Patent US Patent 7,443,187

Enhanced signal observability for circuit analysis
Chandler Todd McDowell, Stanislav Polonsky, Peilin Song, Franco Stellari, Alan J. Weger
Patent US Patent 7,446,550
US Patent 7,446,550


2007

Optical trigger for PICA technique
Franco Stellari, Peilin Song
Patent US Patent 7,239,157



2006

Stuck-at fault scan chain diagnostic method
Franco Motika, Philip J. Nigh, Peilin Song
Patent US Patent 7,010,735

Method and system for providing interactive testing of integrated circuits
Todd M. Burdine, Franco Motika, Peilin Song
Patent US Patent 7,089,474

Programmable jitter signal generator
Keith A. Jenkins, Jien-Chung Lo, Peilin Song, Tian Xia
Patent US Patent 7,095,264



2004

Random path delay testing methodology
Kevin William McCauley, William Vincent Huott, Mary Prilotski Kusko, Peilin Song, Richard Frank Rizzolo, Ulrich Baur, Franco Motika
Patent US Patent 6,728,914

VLSI chip test power reduction
Peilin Song, Timothy J. Koprowski, Ulrich Baur, Franco Motika
Patent US Patent 6,816,990


2003

AC scan diagnostic method
Franco Motika, Phillip J. Nigh, Peilin Song
Patent US Patent 6,516,432

Global transition scan based AC method
Franco Motika, Richard F. Rizzolo, Peilin Song, William V. Huott, Ulrich Baur
Patent US Patent 6,662,324


2002

Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis
Timothy J. Koprowski, Mary P. Kusko, Richard F. Rizzolo, Peilin Song
Patent US Patent 6,442,720


Scan structure for improving transition fault coverage and scan diagnostics
Peilin Song, Richard F. Rizzolo, Franco Motika, Ulrich W. Baur
Patent US Patent 6,490,702