Eugene (Gene) Ratzlaff  Eugene (Gene) Ratzlaff photo       

contact information

CI / DevOps for Quantum Computing || P10 Verification
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash4426

links



2009

Handwriting recognizer user interface methods
Ratzlaff, Eugene Henry and Chee, Yin-Min
US Patent 7,502,017
Abstract


2008



2007

Methods and apparatus for automatic page break detection
Paul Turquand Keyser, Michael Peter Perrone, Eugene H Ratzlaff, Jayashree Subrahmonia
US Patent 7,260,779


2004

Method for encoding regular expressions in a lexigon
Nathan, Krishna S and Ratzlaff, Eugene H
US Patent 6,757,647
Abstract

System and method for automatic quality assurance of user enrollment in a recognition system
James R Lewis, Julia E Maners, Kerry A Ortega, Michael P Perrone, Eugene H Ratzlaff, Jayashree Subrahmonia, Ron Van Buskirk, Huifang Wang
US Patent 6,826,306


2003



2002

Retrieving handwritten documents using multiple document recognizers and techniques allowing both typed and handwritten queries
Thomas Kwok, James Moulic, Kenneth Ocheltree, Michael Perrone, John Pitrelli, Eugene Ratzlaff, Gregory Russell, Jayashree Subrahmonia

System and method for providing user-directed constraints for handwriting recognition
James R Lewis, Michael P Perrone, John F Pitrelli, Eugene H Ratzlaff, Jayashree Subrahmonia
US Patent 6,401,067


2001

System and method for displaying page information in a personal digital notepad
Krishna S Nathan, Michael P Perrone, John F Pitrelli, Eugene H Ratzlaff, Jayashree Subrahmonia
US Patent 6,326,957


1998

Real time measurement of etch rate during a chemical etching process
Barbee, Steven George and Heinz, Tony Frederick and Hsiao, Yiping and Li, Leping and Ratzlaff, Eugene Henry and Wong, Justin Wai-chow
US Patent 5,788,801
Abstract


1996

Apparatus for contactless real-time in-situ monitoring of a chemical etching process
Barbee, Steven G and Heinz, Tony F and Li, Leping and Ratzlaff, Eugene H
US Patent 5,573,623
Abstract

Measuring film etching uniformity during a chemical etching process
Barbee, Steven G and Heinz, Tony F and Hsiao, Yiping and Li, Leping and Ratzlaff, Eugene H and Wong, Justin W
US Patent 5,489,361
Abstract

Method for contactless real-time in-situ monitoring of a chemical etching process
Barbee, Steven G and Heinz, Tony F and Li, Leping and Ratzlaff, Eugene H
US Patent 5,480,511
Abstract

Minimizing overetch during a chemical etching process
Barbee, Steven G and Heinz, Tony F and Hsiao, Yiping and Li, Leping and Ratzlaff, Eugene H and Wong, Justin W
US Patent 5,501,766
Abstract

Chemical etch monitor for measuring film etching uniformity during a chemical etching process
Barbee, Steven G and Heinz, Tony F and Hsiao, Yiping and Li, Leping and Ratzlaff, Eugene H and Wong, Justin W
US Patent 5,573,624
Abstract

Contactless real-time in-situ monitoring of a chemical etching
Balconi-Lamica, Michael J and Barbee, Steven G and Heinz, Tony F and Hsiao, Yiping and Li, Leping and Ratzlaff, Eugene H and Wong, Justin Wai-chow
US Patent 5,516,399
Abstract


1995

Fixture for in-situ noncontact monitoring of wet chemical etching with passive wafer restraint
Barbee, Steven G and Heinz, Tony F and Li, Leping and Ratzlaff, Eugene H
US Patent 5,451,289
Abstract

Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process
Barbee, Steven G and Datta, Madhav and Heinz, Tony F and Li, Leping and Ratzlaff, Eugene H and Shenoy, Ravindra V
US Patent 5,456,788
Abstract


1994

Contactless real-time in-situ monitoring of a chemical etching process
Barbee, Steven G and Heinz, Tony F and Li, Leping and Ratzlaff, Eugene H
US Patent 5,338,390
Abstract