Robert L. (Bob) Wisnieff  Robert L. (Bob) Wisnieff photo       

contact information

Senior Manager Microelectronics Research Laboratory
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash3424

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Professional Associations

Professional Associations:  IEEE, Senior Member


2011

Multi-Layer Epitaxial Graphene Formed from Poly-Crystalline Silicon Carbide Grown on C-Plane Sapphire
McArdle, Timothy and Chu, Jack and Zhu, Yu and Liu, Zihong and Krishnan, Mahadevaiyer and Breslin, Chris and Dimitrakopoulos, Christos and Wisnieff, Robert and Grill, Alfred
APS Meeting Abstracts, pp. 36004, 2011

Effect of SiC wafer miscut angle on the morphology and Hall mobility of epitaxially grown graphene
Dimitrakopoulos, Christos and Grill, Alfred and McArdle, Timothy J and Liu, Zihong and Wisnieff, Robert and Antoniadis, Dimitri A
Applied Physics Letters 98(22), 222105, AIP Publishing, 2011

Multilayer epitaxial graphene formed by pyrolysis of polycrystalline silicon-carbide grown on c-plane sapphire substrates
McArdle, Timothy J and Chu, Jack O and Zhu, Yu and Liu, Zihong and Krishnan, Mahadevaiyer and Breslin, Christopher M and Dimitrakopoulos, Christos and Wisnieff, Robert and Grill, Alfred
Applied Physics Letters 98(13), 132108, AIP Publishing, 2011


2010

Integration of Photo-Patternable Low-$kappa$ Material into Advanced Cu Back-End-Of-The-Line
Lin, Qinghuang and Nelson, Alshakim and Chen, Shyng-Tsong and Brock, Philip and Cohen, Stephan A and Davis, Blake and Kaplan, Richard and Kwong, Ranee and Liniger, Eric and Neumayer, Debra and others
Japanese Journal of Applied Physics 49(5S2), 05FB02, IOP Publishing, 2010

Optimization of wafer-scale graphene epitaxy on SiC for high frequency devices
Grill, Alfred and Dimitrakopoulos, Christos and Lin, Yu-ming and Freitag, Marcus and Han, Shu-jen and Chen, Zhihong and Jenkins, Keith A and Zhu, Yu and McArdle, Timothy and Ott, John and others
Meeting Abstracts, pp. 1184--1184, 2010

Wafer-scale epitaxial graphene growth on the Si-face of hexagonal SiC (0001) for high frequency transistors
Dimitrakopoulos, Christos and Lin, Yu-Ming and Grill, Alfred and Farmer, Damon B and Freitag, Marcus and Sun, Yanning and Han, Shu-Jen and Chen, Zhihong and Jenkins, Keith A and Zhu, Yu and others
arXiv preprint arXiv:1006.0980, 2010


2000

Electronic displays for information technology
Wisnieff, Robert L and Ritsko, John J
IBM Journal of Research and Development 44(3), 409--422, IBM, 2000


1998

Thin-film-transistor process-characterization test structures
Colgan, Evan G and Polastre, Robert J and Takeichi, Masatomo and Wisnieff, Robert L
IBM journal of research and development 42(3.4), 481--490, IBM, 1998

A 10.5-in.-diagonal SXGA active-matrix display
Colgan, Evan G and Alt, Paul M and Wisnieff, Robert L and Fryer, Peter M and Galligan, Eileen A and Graham, William S and Greier, Paul F and Horton, Raymond R and Ifill, Harold and Jenkins, Leslie C and others
IBM journal of research and development 42(3.4), 427--444, IBM, 1998

Display technology: Printing screens
Wisnieff, Robert
Nature 394(6690), 225--227, Nature Publishing Group, 1998


1992

Functional testing of TFT/LCD arrays
Jenkins, Leslie C and Polastre, Robert J and Troutman, Ronald R and Wisnieff, Robert L
IBM Journal of Research and Development 36(1), 59--68, IBM Corp., 1992


1991

Characterization of TFT/LCD arrays
Troutman, Ronald R and Jenkins, Leslie C and Polastre, Robert J and Wisnieff, Robert L
Display Research Conference, 1991., Conference Record of the 1991 International, pp. 231--234


1989

Eliminating crosstalk in thin-film transistor/liquid-crystal displays
Howard, Webster E and Alt, Paul M and Wisnieff, Robert L
Electron Devices, IEEE Transactions on 36(9), 1938--1942, IEEE, 1989