Thomas Parnell  Thomas Parnell photo       

contact information

Research Staff Member
Zurich Research Laboratory, Zurich, Switzerland
  +41dash44dash724dash84dash76

links

Professional Associations

Professional Associations:  IEEE Member


2017

Large-Scale Stochastic Learning using GPUs
T. Parnell, C. Duenner, K. Atasu, M. Sifalakis, H. Pozidis
The 6th International Workshop on Parallel and Distributed Computing for Large Scale Machine Learning and Big Data Analytics (ParLearning 2017)

Scalable and interpretable product recommendations via overlapping co-clustering
R. Heckel, M. Vlachos, T. Parnell, C. Duenner
2017 IEEE International Conference on Data Engineering


2016

High-Performance Distributed Machine Learning using Apache SPARK
C. Duenner, T. Parnell, K. Atasu, M. Sifalakis, H. Pozidis
2016

Capacity of the MLC NAND Flash Channel
T. Parnell, C. Duenner, T. Mittelholzer, N. Papandreou
IEEE Journal on Selected Areas in Communications (JSAC) 34(9), IEEE, 2016

Improving the error-floor performance of binary half-product codes
T. Mittelholzer, T. Parnell, N. Papandreou, H. Pozidis
The International Symposium on Information Theory and its Applications (ISITA), 2016

Effect of Read Disturb on Incomplete Blocks in MLC NAND Flash Arrays
N. Papandreou, T. Parnell, T. Mittelholzer, H. Pozidis, T. Griffin, G. Tressler, T. Fisher, C. Camp
IEEE 8th International Memory Workshop (IMW), 2016




2015

Performance of Cell-to-Cell Interference Mitigation in 1y-nm MLC Flash Memory
T. Parnell, N. Papandreou, T. Mittelholzer, H. Pozidis
Non-Volatile Memory Technology Symposium (NVMTS), 2015

Symmetry-based Subproduct Codes
T. Mittelholzer, T. Parnell, N. Papandreou, H. Pozidis
International Symposium on Information Theory (ISIT), IEEE, 2015

Modelling of the Threshold Voltage Distributions of Sub-20nm NAND Flash Memory
T. Parnell, N. Papandreou, T. Mittelholzer, H. Pozidis
presented at Non-Volatile Memories Workshop (NVMW), 2015

Does Soft-Decision ECC Improve Endurance?
T. Parnell
presented at Flash Memory Summit, 2015

Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization
N. Papandreou, T. Parnell, H. Pozidis, T. Mittelholzer, E. Eleftheriou, C. Camp, G. Tressler, A. Walls
Transactions on Design Automation of Electronic Systems (TODAES) - Special Issue on Reliable, Resilient, and Robust Design of Circuits and Systems 20(4), ACM , 2015

Endurance Limits of MLC NAND Flash
T. Parnell, C. Duenner, T. Mittelholzer, N. Papandreou, H. Pozidis
International Conference on Communications (ICC), IEEE, 2015

Phase Change Memory: A Reliability and System-Level Perspective
H. Pozidis, T. Mittelholzer, N. Papandreou, T. Parnell, M. Stanisavljevic
Transactions on Magnetics 51(4), IEEE, 2015


2014


Modelling of the Threshold Voltage Distributions of Sub-20nm NAND Flash Memory
T. Parnell, N. Papandreou, T. Mittelholzer, H. Pozidis
Global Telecommunications Conference (GLOBECOM), IEEE, 2014

Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems
N. Papandreou, T. Parnell, H. Pozidis, T. Mittelholzer, E. Eleftheriou, C. Camp, T. Griffin, G. Tressler, A. Walls
24th Great Lakes Symposium on VLSI (GLSVLSI), pp. 151-156, 2014


2011

Information storage and retrieval for probe storage using optical diffraction patterns
J. W. van Honschoten, H. W. de Jong, W. W. Koelmans, T. P. Parnell, O. Zaboronski
Journal of Applied Physics 110(10), 2011


2009

Performance Evaluation of the Probe Storage Channel
T.P. Parnell, H. Pozidis, O.V. Zaboronski
Global Telecommunications Conference (GLOBECOM), pp. 1-6, IEEE, 2009


2008

Forward Message Passing Detector for Probe Storage
T. Parnell, H. Pozidis, O.V. Zaboronski
International Conference on Communications (ICC), pp. 1967-1971, IEEE , 2008

Viterbi Detector for Non-Markov Recording Channels
S. Gratrix, R. Jackson, T. Parnell, O. Zaboronski
Transactions on Magnetics 44(1), 198-206, IEEE , 2008