Peilin Song  Peilin Song photo       

contact information

Principal RSM & Manager, Circuit Test and Diagnostics Technologies
Thomas J. Watson Research Center, Yorktown Heights, NY USA
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Professional Associations

Professional Associations:  IEEE Circuits and System Society  |  IEEE Computer Society


  • 11 IBM Invention Achievement Awards, 1999-2012
  • Advisory Board Member,City College of the City University of New York, Department of Electrical Engineering, 2003-2009
  • IEEE Computer Society (CS) Certificate of Appreciation Award, 2007
  • IEEE Computer Society (CS) Outstanding Contribution Award , for outstanding services to the IEEE North Atlantic Test Workshop for more than 10 years, including Program Chair for 2003-2004; and General Chair for 2005-2006, 2006
  • IEEE Computer Society (CS) Certificate of Appreciation Award, 2005
  • IEEE Electron Device Society (EDS) Paul Rapparport Award , 2004
  • Best Paper Award, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2004
  • IBM Invention Achievement Awards – High Value Patent Issue, US Patent 6,516,432, “AC scan diagnostic method” , IBM Corp., 2003
  • IBM Invention Achievement Awards – High Value Patent Issue, US Patent 6,662,324, “Global transition scan based AC method”, IBM Corp., 2003
  • IBM Research Division Award, "Latchup Elimination in CMOS SF Technologies" , IBM Research Division, 2003
  • Best Paper Award, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2002
  • IBM Outstanding Technical Achievement Award, “S/390 Generation 6 Test Development and Diagnostics” , IBM Corp., 1999
  • IBM Outstanding Technical Achievement Award, “S/390 Generation 5 Processor Diagnostics Development” , IBM Corp., 1998