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Research Areas

  • Materials Science

Additional Information

  • IBM Research - Almaden | Science & Technology
  • Scientific Services

Techniques

Auger Electron Spectroscopy

Field Emission Transmission Electron Microscopy

Focused Ion Beam (FIB)

Ion Beam Surface Analysis

Nanoindentation

Nuclear Magnetic Resonance (NMR) analysis

Scanning Probe Laboratory

Secondary Ion Mass Spectroscopy (SIMS)

Specular X-ray Reflectivity

Thermal Analysis

X-ray Diffraction

X-ray Photoelectron Spectroscopy (XPS)

Project Name

Materials Analysis


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  • Overview

The ion beams laboratory at Almaden uses a 3.6 MeV Pelletron to generate ion beams for the following types of thin-film analysis:

  • Rutherford backscattering spectrometry (RBS)
  • Forward recoil spectrometry (FRS)
  • Particle induced X-ray emission (PIXE)
  • Nuclear resonance analysis (NRA)

Ion Beam surface interaction

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