A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques

S. Cohen, J.C. Liu, et al.

MRS Spring Meeting 1999

Priyanka Periwal, Joachim Dahl Thomsen, et al.

Applied Physics Reviews

K.N. Tu, K.P. Rodbell, et al.

Materials Chemistry and Physics

Jifeng Chen, Peilin Song, et al.

ISTFA 2012