A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques

Paper

01 Aug 2002

Abstract

No abstract available.

Paper

J.M.E. Harper, K.P. Rodbell, et al.

Journal of Applied Physics

Paper

C.E. Murray, K.P. Rodbell

Journal of Applied Physics

Conference paper

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MRS Spring Meeting 1994

Paper

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Nanotechnology