K. Vieregge, D. Gupta
TMS Annual Meeting on Recent Advances in Tungsten and Tungsten Alloys 1991
rf sputter etching has been successful tested for microsectioning and profiling of Au195 radioactive tracer self-diffusion into Au. It was possible to obtain sections of only 50 Å thickness in a reproducible manner and measure extremely small diffusion coefficients. The technique is expected to lend itself universally for diffusion microsectioning. © 1970 The American Institute of Physics.
K. Vieregge, D. Gupta
TMS Annual Meeting on Recent Advances in Tungsten and Tungsten Alloys 1991
S.G. Fishman, D. Gupta, et al.
Physical Review B
G.M. Hood, H. Zou, et al.
Journal of Nuclear Materials
R.D. Thompson, D. Gupta, et al.
Physical Review B