Conference paper
TEMPERATURE DEPENDENCE OF STRESSES IN Ti, Cr, AND Cu THIN FILMS.
C.-K. Hu, D. Gupta, et al.
VMIC 1984
rf sputter etching has been successful tested for microsectioning and profiling of Au195 radioactive tracer self-diffusion into Au. It was possible to obtain sections of only 50 Å thickness in a reproducible manner and measure extremely small diffusion coefficients. The technique is expected to lend itself universally for diffusion microsectioning. © 1970 The American Institute of Physics.
C.-K. Hu, D. Gupta, et al.
VMIC 1984
D. Gupta, P.S. Ho
Thin Solid Films
D. Gupta
Canadian Metallurgical Quarterly
C.-K. Hu, K.L. Lee, et al.
MRS Spring Meeting 1996