Conference paper
Low temperature SER and noise in a high speed DRAM
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989
A technique for accurately measuring small superconductive inductances is presented. The inductance to be measured is inserted into a two-junction interferometer into which control current is directly injected. The method was used to measure the penetration depth of a Pb-In-Au alloy film and the effect of magnetic field fringing into a narrow superconductive stripline.
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989
W.H. Henkels, N.C.-C. Lu, et al.
VLSI-TSA 1989
W.H. Henkels, W. Hwang
IEEE Journal of Solid-State Circuits
W. Hwang, R.V. Joshi, et al.
ICCD 1997