K.A. Chao
Physical Review B
Paper
Adhesion of copper and chromium films to polyimide studied by static SIMS of the interface
Abstract
No abstract available.
Related
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
A. Reisman, M. Berkenblit, et al.
JES
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures