R. Ghez, J.S. Lew
Journal of Crystal Growth
To meet the European Union Restriction of Hazardous Substances requirements and the continuing demand for lower costs, finer pitch, and high-reliability flip-chip packaging structures, considerable work is going on in the electronic industry to develop lead-free solutions for flip-chip technology. In this paper various solder-bumping technologies developed for flip-chip applications are reviewed with an emphasis on a new wafer-bumping technology called C NP (Controlled-Collapse-Chip-Connect New Process). Several inherent advantages of C NP technology are discussed over other technologies. This paper will also discuss the recent development and implementation of lead-free C interconnections for 300 mm wafers demonstrated at IBM. In addition, some metallurgical considerations associated with C NP technology are discussed.
R. Ghez, J.S. Lew
Journal of Crystal Growth
P.C. Pattnaik, D.M. Newns
Physical Review B
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films