Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
This paper is concerned with the statistical analysis of first-order linear distributed-parameter systems with random parameters and random inputs. In both cases, Gaussian processes are assumed. This work essentially extends the statistical theory available for analyzing random linear lumped-parameter systems to a restricted class of distributed-parameter systems. © 1963.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Charles Micchelli
Journal of Approximation Theory
John S. Lew
Mathematical Biosciences
F.M. Schellenberg, M. Levenson, et al.
BACUS Symposium on Photomask Technology and Management 1991