Mihir Parikh
Journal of Applied Physics
SE yield (δ0) data can be interpreted in terms of the Fano plot, thereby yielding a simple formulation of δ0 with respect to the incident electron energy T and a correlation between the mean ionization potential 〈I〉 and a parameter in the Fano plot.
Mihir Parikh
Journal of Applied Physics
Mihir Parikh
Journal of Applied Physics
James T. Hall, Paul K. Hansma, et al.
Surface Science
Mihir Parikh, David F. Kyser
Journal of Applied Physics