Conference paper
Model for a 15ns 16K RAM with Josephson junctions
R.F. Broom, P. Gueret, et al.
ISSCC 1978
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom, P. Gueret, et al.
ISSCC 1978
H.P. Meier, R.F. Broom, et al.
Journal of Crystal Growth
R.F. Broom, H.P. Meier, et al.
Journal of Applied Physics
R.F. Broom
Solid-State Electronics