J.H. Glownia, G. Arjavalingam, et al.
Optics Letters
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
J.H. Glownia, G. Arjavalingam, et al.
Optics Letters
Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
G. Arjavalingam, N. Theophilou, et al.
The Journal of Chemical Physics
W. Robertson, G.V. Kopcsay, et al.
IEE/LEOS Summer Topical Meetings 1991