Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
No abstract available.
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
Michael E. Henderson
International Journal of Bifurcation and Chaos in Applied Sciences and Engineering