S.E. Laux, A. Kumar, et al.
IEDM 2002
A compact model is proposed to evaluate the tunneling current across the insulator of metal-oxide-semiconductor structures. The model is based on a questionable approximation for the 'transparency factor'. It was shown that the argument brought forward to explain the negligible effect of the image-induced barrier-lowering ignores simple concepts of electrostatics.
S.E. Laux, A. Kumar, et al.
IEDM 2002
F. Gámiz, M.V. Fischetti
Applied Physics Letters
M.V. Fischetti, S.E. Laux, et al.
Journal of Applied Physics
P. Braunlich, S.C. Jones, et al.
SPIE Laser-Induced Damage in Optical Materials 1989