G. Hu, Teya Topuria, et al.
IEEE Magnetics Letters
Paper
Conducting atomic-force-microscope electrical characterization of submicron magnetic tunnel junctions
Abstract
The ability to electrically characterize submicron magnetic tunnel junctions (MTJ) using a conducting atomic force microscopy (CAFM) was discussed. The brief processing was found to save time and resources, and reduced the potential for damage to the MTJs. The sample requirements, CAFM processing route and the tip preparation were also elaborated.
Related
David W. Abraham, T.J. Chainer, et al.
IEEE Transactions on Magnetics
J.Z. Sun, M.C. Gaidis, et al.
Applied Physics Letters
Jonathan Z. Sun, R.P. Robertazzi, et al.
Physical Review B - CMMP