T.G.W. Blake, Ching-Cheng Shir, et al.
IEEE Transactions on Magnetics
The slip near the solid/liquid/fluid contact line is described by a phenomenological model in which the slip coefficient is inversely proportional to the liquid film thickness. The proportionality constant is so small that there is practically no slip anywhere except near the contact line where the slip mechanism is adequately described. The evolution of the free surface and the slippage of the contact line can be computed. Results for the case of constant viscosity are presented. The slip rate at the contact line is given in terms of material parameters of density, viscosity, and the rotating speed of the disk as well as the empirical slip proportionality constant. Accordingly, the way to control the slippage of the contact line is clearly indicated. © 1987.
T.G.W. Blake, Ching-Cheng Shir, et al.
IEEE Transactions on Magnetics
Yih-O Tu
Mathematics and Computers in Simulation
Yih-O Tu
IEEE Transactions on Magnetics
Yih-O Tu
Journal of Applied Physics