PaperUltra low contact resistivities for CMOS beyond 10-nm nodeZhen Zhang, Siyuranga Obasa Koswatta, et al.IEEE Electron Device Letters
Conference paperTunnel Current Measurements on P/N Junction Diodes and Implications for Future Device DesignPaul M. Solomon, David J. Frank, et al.IEDM 2003
PaperThe quantum metal ferroelectric field-effect transistorDavid J. Frank, Paul M. Solomon, et al.IEEE T-ED
PaperEffect of uniaxial strain on the drain current of a heterojunction tunneling field-effect transistorPaul M. Solomon, Isaac Lauer, et al.IEEE Electron Device Letters
