On the dynamic resistance and reliability of phase change memory
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
The CrLVV Auger emission has been used to investigate the local chemical environment of Cr(VI) in connection with the photoreduction produced by a non-monochromatic X-ray source. We compared Cr(VI) in oxides on anodized Al exposed to a chromate solution, with Cr(VI) in oxides on Al/Cr alloys polarized in a borate solution. The former were found to be much more sensitive to photoreduction than the latter. This is correlated with the intensity of the CrLVV Auger emission, attributed to a charge transfer transition in the final state of the photoemission process. © 1991.
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
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APS Global Physics Summit 2025
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Advanced Materials
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Physica A: Statistical Mechanics and its Applications