Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

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Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

Paper

Electron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and Circuits

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IEEE T-ED

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Substrate coupling noise issues in silicon technology

Keith A. Jenkins

SiRF 2004

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Graphene-based fast electronics and optoelectronics

Ph. Avouris, Yu-Ming Lin, et al.

IEDM 2010

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A local random variability detector with complete digital on-chip measurement circuitry

Rahul Rao, Keith A. Jenkins, et al.

IEEE Journal of Solid-State Circuits

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Abstract

Related

Electron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and Circuits

Substrate coupling noise issues in silicon technology

Graphene-based fast electronics and optoelectronics

A local random variability detector with complete digital on-chip measurement circuitry