Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Dielectric screening and zone-center phonons in Si
Abstract
We present a microscopic calculation of the zone-center phonon frequencies of silicon. The electronic contributions to the phonons are fully incorporated into the dynamical matrix via the dielectric matrix G',G'. The acoustic sum rule is shown to be satisfied. © 1978 The American Physical Society.
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