D. Gupta, P.S. Ho
Thin Solid Films
Diffusion of Ag110m radioactive tracer has been measured in amorphous Pd-19-at.%-Si specimens characterized by a Seeman-Bohlin x-ray diffractometer. The diffusion parameters in this metallic amorphous phase have been found to have a regime distinctly different from liquid and crystalline phases. © 1975 The American Physical Society.
D. Gupta, P.S. Ho
Thin Solid Films
M. Eizenberg, K.N. Tu
Journal of Applied Physics
M. Wittmer, K.N. Tu
Physical Review B
K.N. Tu
Journal of Applied Physics