R. Ghez, J.S. Lew
Journal of Crystal Growth
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
R. Ghez, J.S. Lew
Journal of Crystal Growth
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
J.C. Marinace
JES
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry