Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
R. Ghez, M.B. Small
JES
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Peter J. Price
Surface Science