PaperMagnetization reversal in multilayer film-device structuresH. Chang, E.R. Genovese, et al.Journal of Applied Physics
PaperNanosecond microscopic Kerr magneto-optic apparatus and measurement techniquesE.R. Genovese, H. ChangReview of Scientific Instruments
PaperNanosecond Microscopic Measurement of Magnetic Film Switching by Kerr Magneto‐Optic ApparatusD.A. Thompson, H. Changphysica status solidi (b)