PaperIsolation of type-2 magnetic contrast in the SEM by a lock-in techniqueOliver C. WellsApplied Physics Letters
PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperMagnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In TechniqueOliver C. Wells, Richard J. SavoyIEEE Transactions on Magnetics
PaperLow-loss electron images of uncoated photoresist in the scanning electron microscopeOliver C. WellsApplied Physics Letters