Conference paper
Past, present, and future of backscatter electron (BSE) imaging
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
No abstract available.
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
Oliver C. Wells, David C. Joy
Surface and Interface Analysis
John A. Allgair, Victor V. Boksha, et al.
SPIE Advanced Microelectronic Manufacturing 2003
Oliver C. Wells
Scanning