Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
We investigate electrical transport and noise in semiconducting carbon nanotubes. By studying carbon nanotube devices with various diameters and contact metals, we show that the ON-currents of CNFETs are governed by the heights of the Schottky barriers at the metal/nanotube interfaces. The current fluctuations are dominated by 1 / f noise at low-frequencies and correlate with the number of transport carriers in the device regardless of contact metal. © 2006 Elsevier B.V. All rights reserved.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
T. Schneider, E. Stoll
Physical Review B
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials