Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Electron scattering in silicon inversion layers by oxide and surface roughness
Abstract
No abstract available.
Related
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Ellen J. Yoffa, David Adler
Physical Review B
A. Reisman, M. Berkenblit, et al.
JES