Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Eloisa Bentivegna
Big Data 2022
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry