PaperSample holder for diffraction and other studies in ultrahigh vacuumF. Jona, H.R. WendtReview of Scientific Instruments
PaperBoron diffusion in silicon at high concentrationsW.A. Orr Arienzo, R. Glang, et al.Journal of Applied Physics
PaperRandom occupation of adsorption sites in the C (2×2) structure of CO on Fe{001}F. Jona, K.O. Legg, et al.Physical Review Letters
