R. Ghez, J.S. Lew
Journal of Crystal Growth
Using thermal co-evaporation we have prepared epitaxial Cu 2ZnSnS4 (CZTS) films on Si(001) substrates. A substrate temperature as high as 370 C and proper substrate cleaning (HF-dip followed by thermal desorption of surface hydrogens) are found to be necessary for the epitaxial growth. Detailed transmission electron microscopy measurements and X-ray diffraction studies are used to reveal the orientation relation of the CZTS films with the underlying silicon substrate, and the formation of defects within the CZTS layer. © 2014 Elsevier B.V.
R. Ghez, J.S. Lew
Journal of Crystal Growth
A. Krol, C.J. Sher, et al.
Surface Science
J. Tersoff
Applied Surface Science
P.C. Pattnaik, D.M. Newns
Physical Review B