M.B. Small, R.M. Potemski
Journal of Crystal Growth
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
M.B. Small, R.M. Potemski
Journal of Crystal Growth
B. Monemar, R.M. Potemski, et al.
Physical Review Letters
E. Tierney, J. Angilello
JES
M.A. Tischler, R.M. Potemski, et al.
Journal of Crystal Growth