N.-H. Cho, Kannan M. Krishnan, et al.
Applied Physics Letters
The interfacial coupling energy, Δσ for polycrystalline Ni 0.8Fe0.2 (100 Å)/MnxPt1-x. (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1-x composition range 0.42 <x<0.76 and t∼350 Å. Δσ exhibits a sharp peak of 0.1 erg/cm 2 at 51% Mn. We compare the magnetic and microstructural properties of two bilayer films, which have the same compositions of permalloy and Mn xPt1-x: [Ni0.85Fe0.15(100 Å)/Mn0.49Pt0.51(t Å)]. In one case (normal structure), the epitaxial permalloy was grown first onto Pt/MgO(001), followed by 170 Å of Mn0.49Pt0.51. In the other structure (inverted), a 350 Å thick polycrystalline film of Mn0.49Pt 0.51 was grown onto a SiO2 substrate, followed by permalloy. The structures exhibited very different exchange bias fields (32 versus 86 Oe) and Δσ values (0.021 versus 0.060 erg/cm2), respectively. Significant differences in texture, grain size, and Mn 0.49Pt0.51 layer thickness for the two samples are reported. © 1998 American Institute of Physics.
N.-H. Cho, Kannan M. Krishnan, et al.
Applied Physics Letters
F.M. Ross, K.M. Krishnan, et al.
MRS Bulletin
M.A. Brewer, Kannan M. Krishnan, et al.
Journal of Applied Physics
R.F.C. Farrow, S.S.P. Parkin, et al.
Applied Physics Letters