PaperStructural and electronic characterization of a dissociated dislocation in GeSiP.E. BatsonPhysical Review B - CMMP
PaperKink site saturation mechanism for whisker growth under sputtering conditionsJ.A. Van Vechten, W. Solberg, et al.Journal of Crystal Growth
PaperAnisotropy in the near-edge absorption fine structure of YBa2Cu3O7-P.E. Batson, M.F. ChisholmPhysical Review B
PaperApplication of electron and ion beam analysis techniques to microelectronicsT.S. Kuan, P.E. Batson, et al.IBM J. Res. Dev
