Terry I. Chappell, Stanley E. Schuster, et al.
IEEE Journal of Solid-State Circuits
Paper
Experimental Study of Laser Formed Connections for LSI Wafer Personalization
Abstract
Expenmental studies of connections formed in MOS-type structures by nanosecond dye laser pulses are described. Of particular importance are results relating to the reliability and reproducibility of the connection process. A model for the connection process is presented which correlates well with the various observations and experiments. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
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