PaperModeling and forecasting of defect-limited yield in semiconductor manufacturingMichael Baron, Asya Takken, et al.IEEE Trans Semicond Manuf
PaperConsistent estimation in generalized broken-line regressionRyan Gill, Michael BaronJournal of Statistical Planning and Inference
PaperParametric estimation for window censored recurrence dataYada Zhu, Emmanuel Yashchin, et al.Technometrics
PaperGradient analysis of Markov-type control schemes and its applicationsEmmanuel YashchinCommun. Stat. Simul. Comput.
