C.-K. Hu, R. Rosenberg, et al.
Applied Physics Letters
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
C.-K. Hu, R. Rosenberg, et al.
Applied Physics Letters
J. Wróbel, T. Brandes, et al.
EPL
E. Kratschmer, H.S. Kim, et al.
IVMC 1995
T.P. Smith III, W.I. Wang, et al.
Physical Review B