Jacob Savir
IEEE TC
In this paper we show that good controllability and observability do not guarantee good testability. In fact, one can easily find examples of faults that are difficult or impossible to detect, although both the controllability and observability figures are good. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.
Jacob Savir
IEEE TC
Thomas H. Spencer, Jacob Savir
IEEE TC
Jacob Savir, Gary S. Ditlow, et al.
IEEE TC
Jacob Savir
IEEE TC