Conference paperMaterials and process integration issues in metal gate/high-k stacks and their dependence on device performanceA.C. Callegari, K. Babich, et al.ECS Meeting 2007
PaperStructural and electronic characterization of a dissociated dislocation in GeSiP.E. BatsonPhysical Review B - CMMP
PaperParallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscopeP.E. BatsonReview of Scientific Instruments
PaperArsenic segregation to silicon/silicon oxide interfacesC.Y. Wong, C.R.M. Grovenor, et al.Journal of Applied Physics
