Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
A simple u.v. curing process is described that renders micron sized images in AZ resists resistant to flow when heated to temperatures as high as 210° C. The u.v. treatment prevents the image flow problems usually encountered in reactive ion etching processes. © 1981, The Electrochemical Society, Inc. All rights reserved.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
John G. Long, Peter C. Searson, et al.
JES