Charles C.-H. Hsu, Duen-Shun Wen, et al.
IEEE Transactions on Electron Devices
Paper
IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
Abstract
No abstract available.
Related
George A. Sai-Halasz, Matthew R. Wordeman, et al.
IEEE Electron Device Letters
Steven J. Koester, Albert M. Young, et al.
IBM J. Res. Dev
Toshiaki Kirihata, Yohji Watanabe, et al.
IEEE Journal of Solid-State Circuits