J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Paper
In Situ X-Ray Absorption Study of Chromium Valency Changes in Passive Oxides on Sputtered ALCr Thin Films Under Electrochemical Control
Abstract
No abstract available.
Related
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999